• RF Probing & EM Field Mapping
• Real-time Signal Probing
• Thermal Probing
• Mechanical Displacements, Vibrations, Stress/Pressure
• Components
• Customized Systems
• Pico-Sense Kits
• Tera-Sense Kits
• Spectra-Sense Kits

Products – RF Probing & EM Field Mapping Systems

• Simultaneous amplitude and phase scan
• Measurement bandwidth up to > 100 GHz
• Scanning spatial resolution as small as 8 µm
• Distinction of separate vector-field-components
• Three different types of probes (EO, MO, and Voltage) can be employed interchangeably
• Internal probing & near-field scanning may be applied to RFICs, antennas, or EMC/EMI characterization
• Wide variety of measurement-bandwidth options
• Point-to-point measurements or scanning for areas spanning less than square-millimeters to over square meters and up

Need more information?

Do you want to know about RF probing/Field Mapping systems from AFS? You are not quite sure what system you would need? Please let us listen to your requirements so that we can help suggest the most appropriate solution for you.