Technologies – Technical Papers
The following papers provide background on the technology licensed by AFS and employed in our products and services.
K. Yang, G. David, S. Robertson, J.F. Whitaker, and L.P.B. Katehi, “Electro-optic mapping of near-field distributions in integrated microwave circuits,” IEEE Trans. Microwave Theory Tech., vol. 46, pp. 2338-2343 (Dec. 1998).
K. Yang, G. David, J.-G. Yook, I. Papapolymerou, L.P.B. Katehi, and J.F. Whitaker, “Electro-optic mapping and finite element modeling of the near-field pattern of a microstrip patch antenna,” IEEE Trans. Microwave Theory Tech., vol. 48, pp. 288-294 (Feb. 2000).
K. Yang, T. Marshall, M. Forman, J. Hubert, L. Mirth, Z. Popovic, L.P.B. Katehi, and J.F. Whitaker, “Active-amplifier-array diagnostics using high-resolution electro-optic field mapping,” IEEE Trans. Microwave Theory Tech., vol. 49, pp. 849-857 (May 2001).
K. Yang, LRB. Katehi, and J.F. Whitaker, “Electric-field mapping system using an optical-fiber-based electro-optic probe,” IEEE Microwave Wireless Comp. Lett., vol. 11, pp. 164-166 (Apr. 2001).
R.M. Reano, K. Yang, J.F. Whitaker, and L.P.B. Katehi, “Simultaneous measurements of electric and thermal fields utilizing an electrooptic semiconductor probe,” IEEE Trans. Microwave Theory Tech., Vol. 49, pp. 2523-2531 (Dec. 2001).
